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Stress Birefringence Measurement in Optics

Hinds Instruments Inc.Request Info
 
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SPIE Photonics West 2022 Booth: 330

Stress Birefringence Measurement The new Exicor 120AT system was designed specifically for small samples. The 120AT offers the same low signal-to-noise and retardation resolution you have come to expect from the award winning Exicor series. Included in the new design is an upgraded sample stage which offers the user up to 15 samples/sec at 1 mm spacing.



Published: December 2021
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