Spectrally Controlled Interferometry
Apre InstrumentsRequest Info
SPIE Photonics West 2018 Booth: 5433
Spectrally Controlled Interferometry (SCI) electronically controls the interferometer’s source coherence. Measure only the surface of interest without the confusing multiple-surface interference that prohibits measurement. Control the coherence for a fast setup in the “laser” mode; then isolate the surface you want to measure in the “white-light” mode; all the way down to 150 µm optical thickness. Contact us today, or visit www.apre-inst.com/sci for more information.
https://www.apre-inst.com/sci
/Buyers_Guide/Apre_Instruments/c22101
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