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Semiconductor Failure Analyzer

QuantumDiamonds GmbHRequest Info
 
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QuantumDiamonds Semiconductor Failure AnalyzerThe QD m.0 from QuantumDiamonds GmbH is a quantum based device designed for semiconductor chip failure analysis. The system utilizes diamond-based quantum microscopy to detect and localize faults in integrated circuits. The QD m.0 has the ability to extract electrical current information across multiple layers of 2.5D/3D packages and chiplet-based architectures.



Published: October 2024
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Productsscanning electron microscopesTest & MeasurementsemiconductorsquantumchipsPICsintegrated photonicsquantum microscopyindustrialEuropeQuantumDiamonds

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