SAMPLE ANALYSIS
JEOL USA Inc.Request Info
By combining the SMI2000MS series focused ion beam (FIB) tool from Seiko and the JEM-2500SE scanning transmission electron microscope from JEOL USA Inc., the two companies have developed a high-throughput technique for preparing cross-sectional samples and imaging features smaller than 90 nm. Without destroying the wafer, the fully automated FIB prepares and finalizes multipoint specimens at specified locations on 200- or 300-mm wafers. A gallium-ion beam converts the specified cross section into a 100-nm layer. The microscope then produces images with resolution of 0.2 nm, which, according to the company, is five times the resolution of scanning electron microscope tools
https://www.jeolusa.com
/Buyers_Guide/JEOL_USA_Inc/c7365
Published: September 2003
REQUEST INFO ABOUT THIS PRODUCT
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:
Message:
When you click "Send Request", we will record and send your personal contact information to JEOL USA Inc. by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our
Privacy Policy and
Terms and Conditions of Use.
Register or login to auto-populate this form:
Login
Register
* Required