Probe Card
Jenoptik Optical Systems LLCRequest Info
The UFO Probe® Vertical from Jenoptik is a probe card made for testing photonic integrated circuits (PICs) at wafer level. The probe card enables parallel functional tests of optical and electrical components on chips using vertical needle technology allowing the user to couple up to 32 optical channels in parallel without active alignment. The chip covers wavelengths from 1260 to 1625 nm and up to 6000 bond pads with dimensions down to 35 μm can be contacted.
https://www.jenoptik.com
/Buyers_Guide/Jenoptik_Optical_Systems_LLC/c31639
Published: October 2023
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