Optical Profilometer
Bruker Nano SurfacesRequest Info
The NPFLEX-1000 optical profilometer from Bruker Corp. features large form-factor gantry and robust bridge architecture for fast, automated areal measurements of surface texture and roughness.
The white-light interferometry system provides sample-size flexibility with 300 mm of space below the objective lens, a swivel head, and long working distance objectives. In addition, high-slope surface access is significantly extended via a fold mirror option. Fast, automated measurements and full analysis is possible within 10 s, translating to improvements in throughput for production environments.
https://www.bruker.com/nano
/Buyers_Guide/Bruker_Nano_Surfaces/c19385
Published: February 2023
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