Nanoscale IR Spectroscopy System
Park Systems Corp.Request Info
The Park NX-IR R300 nanoscale IR spectroscopy system from Park Systems Corp. joins with atomic force microscopy for up to 300-mm semiconductor wafers.
It provides chemical property information as well as mechanical and topographical data for semiconductor research, failure analysis, and defect characterization at high nano resolution. Photo-induced force microscopy spectroscopy provides chemical identification at <10-nm spatial resolution. It uses a noncontact technique for damage-free spectroscopy probing, high resolution, and accuracy throughout scans. Users obtain spectroscopy information at varying depths for insight into sample composition.
https://www.parksystems.com
/Buyers_Guide/Park_Systems_Corp/c18079
Published: January 2023
REQUEST INFO ABOUT THIS PRODUCT
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:
Message:
When you click "Send Request", we will record and send your personal contact information to Park Systems Corp. by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our
Privacy Policy and
Terms and Conditions of Use.
Register or login to auto-populate this form:
Login
Register
* Required