Monitor Photodiode

Kyoto Semiconductor Co. Ltd.Request Info

The KPDE008LS-A-RA-HQ monitor photodiode from Kyoto Semiconductor Co. Ltd. is used to monitor the laser output of optical communication equipment.

A wafer prober has been introduced to inspect the electrical characteristics of semiconductor wafers while heated to high temperatures, allowing inspection to test the temperature close to the absolute maximum rated value of the operating temperature of the product. Since the full inspection is implemented to wafers with this prober, higher quality products under higher temperatures can be realized. Sample inspection is conducted by wafer, and the sampled products are sent to the burn-in test. The samples are heated up to the high temperature of 175 °C, and their performance is inspected.

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Published: December 2021

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