High Speed Polarization Imaging
Hinds Instruments Inc.Request Info
SPIE Photonics West 2024 Booth: 3330
Increase your speed and enjoy quantified data while examining collagen samples, imaging myelin, viewing microscopic defects in diamond and analyzing stress in glass, film, polymers, and liquid crystal. Using the Exicor MicroImager measures retardance from 0 to 315 nm in a matter of seconds with a spatial resolution of up to 0.7 µm. Phase Unwrapping technology and our advanced 4 wavelength system allows retardance measurements up to 3500 nm for highly birefringence samples. Visit us at Booth #3330.
https://www.hindsinstruments.com
/Buyers_Guide/Hinds_Instruments_Inc/c6111
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