High-Resolution Reflectometer
Yokogawa Europe BVRequest Info
AMERSFOORT, Netherlands, Jan. 28, 2025 — 
The AQ7420 from Yokogawa Test & Measurement Corporation is a high-resolution reflectometer meant for the internal structure analysis of optical modules and the visualization of microcracks in optical connectors. The reflectometer reduces noise and enables measurement with an uncertainty of ±3 dB as well as insertion loss simultaneously with an uncertainty of ±0.02 dB. The AQ7420 has both a single 1310-nm wavelength and double 1310-nm and 1550-nm wavelength model available with control software for Windows 11.
http://www.tmi.yokogawa.com
/Buyers_Guide/Yokogawa_Europe_BV/c16280
Published: January 2025
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