GigE Industrial Beam Profiler
MKS Ophir, Light & MeasurementRequest Info
The Ophir® SP920G GigE Silicon CCD beam profiling camera accurately captures and analyzes wavelengths from 190 to 1100 nm. Features include high-speed GigE interface, compact design, wide dynamic range, and unparalleled signal-to-noise ratio for measuring CW and pulsed lasers in industrial applications. 1624- × 1224-pixel resolution, 4.4-µm pixel pitch. Includes BeamGage® advanced beam analysis software.
https://www.ophiropt.com/laser--measurement/beam-profilers/products/Beam-Profiling/Camera-Based-Beam-Profiling-with-BeamGage/SP920G-Beam-Profiling-Camera
/Buyers_Guide/MKS_Ophir_Light_Measurement/c10765
Published: August 2018
REQUEST INFO ABOUT THIS PRODUCT
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:
Message:
When you click "Send Request", we will record and send your personal contact information to MKS Ophir, Light & Measurement by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our
Privacy Policy and
Terms and Conditions of Use.
Register or login to auto-populate this form:
Login
Register
* Required