GigE Industrial Beam Profiler
MKS Ophir, Light & MeasurementRequest Info
Photonics West 2019 Booth: 927
The Ophir® SP920G GigE Silicon CCD beam profiling camera accurately captures and analyzes wavelengths from 190nm - 1100nm. Features high–speed GigE interface, compact design, wide dynamic range, and unparalleled signal-to-noise ratio for measuring CW and pulsed lasers in industrial applications. 1624 × 1224 pixel resolution, 4.4µm pixel pitch. Includes BeamGage® advanced beam analysis software.
https://www.ophiropt.com/laser--measurement/node/12162
/Buyers_Guide/MKS_Ophir_Light_Measurement/c10765
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