Axio CSM 700 Microscope
Carl Zeiss Microscopy LLCRequest Info
Confocal Light Microscope
THORNWOOD, N.Y., Jan. 29, 2010 – Carl Zeiss MicroImaging Inc. has expanded the functions on its Axio CSM 700 confocal light microscope to enable materials scientists to measure the 3-D topography over large sample areas more conveniently and with greater flexibility.
The company offers a motorized scanning stage with a 150 × 150-mm travel range that is suitable for materials research, quality inspection and routine applications. Scanning stage control is integrated into the software and allows large sample areas to be captured in a mosaic fashion with high resolution. This function has been further optimized with a stitching algorithm so that no transitions are perceived between the single images in the final mosaic image, and roughness measurement can be determined with a higher statistical reliability, even with large sample areas.
The new encoded and motorized objective nosepiece that now comes standard facilitates operation.
The microscope provides accurate noncontact measurement of low roughness on relatively soft surfaces. It visualizes surfaces three-dimensionally, with high resolution and in true color, and enables precise measurement of 3-D microstructures as well as roughness determination. Topographical measurements can be performed at a rate of more than 100 fps. Additional benefits include the reliable detection of height information with step heights from 20 nm up to the millimeter range, as well as images with a depth of focus otherwise only possible with scanning electron microscopes.
The easy-to-use software provides numerous analysis options, including measurement of roughness, evaluation of layer thickness and particle analysis. Additional functions such as a newly programmed filter facilitate and improve the image processing capabilities.
English units like inches and micro-inches have been integrated into the software for better compliance with material microscopy standards valid in parts of North America, in particular.
http://www.zeiss.com/microscopy
/Buyers_Guide/Carl_Zeiss_Microscopy_LLC/c16324
Published: January 2010
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