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DataRay Inc. - ISO 11146-Compliant Laser Beam Profilers

Autonomous SiPh Measurement

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Autonomous SiPh MeasurementThe CM300xi-SiPh 300-mm probe station is the first verified integrated measurement solution on the market that enables engineering and production-proven, optimized optical measurements right after installation — without further development. This unique Autonomous SiPh Measurement Assistant provides a groundbreaking set of functions that precisely calibrate the optical positioning hardware to the probe station and verify the performance of the integrated system.



Published: July 2021
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Test & Measurement

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