Search
Menu
DataRay Inc. - ISO 11146-Compliant Laser Beam Profilers

Automated Metrology System

EV Group (EVG)Request Info
 
Facebook X LinkedIn Email
Automated Metrology SystemThe EVG®40 NT2 automated metrology system from EV Group provides overlay and critical dimension measurements for wafer-to-wafer, die-to-wafer, and die-to-die bonding, as well as maskless lithography applications.

Designed for high-volume production with feedback loops for real-time process correction and optimization, the EVG40 NT2 helps device manufacturers, foundries, and packaging houses accelerate the introduction of 3D, heterogeneous integration products while improving yields and avoiding the scrapping of highly valuable wafers.



Published: December 2021
REQUEST INFO ABOUT THIS PRODUCT
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:
Message:


When you click "Send Request", we will record and send your personal contact information to EV Group (EVG) by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.

Register or login to auto-populate this form:
Login Register
* Required

ProductsEVG40 NT2automated metrology systemEV GroupTest & MeasurementWafersnanosemiconductorsEurope

We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.