Atomic force microscopy
Bruker Nano GmbH, JPK BioAFMRequest Info
JPK Instruments AG has released the NanoWizard
II, suitable for high-resolution imaging,
force spectroscopy and nanomanipulation/lithography. It has a custom-made scanning
system with capacitive sensors for high-performance closed-loop atomic force microscopy
(AFM). The system provides easy and safe operation under liquid conditions, with
a variety of fluid cells, an electrochemistry cell, temperature-control options,
and improved AFM head vapor and liquid protection. It has a patent-pending Direct Overlay
function that integrates optical imaging with AFM measurements.
It also has updated control electronics with low-noise circuitry, proven eight-channel
data acquisition, easy access to all major signals and software with several new
features.
https://www.jpk.com
/Buyers_Guide/Bruker_Nano_GmbH_JPK_BioAFM/c7449
Published: October 2006
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