John Davis of Particle Measuring Systems will provide an overview of particle generation sources, control methods and ISO standards, to help you achieve a clean environment that maximizes productivity.
Davis will examine performance trends in the optics industry that are driving manufacturers to reduce the contamination levels to which a component is exposed during manufacturing, including cleaning, handling, coating and assembly. He will discuss how quality control can be compromised through component exposure to particulate and molecular contamination, affecting laser damage thresholds in coatings; yields in nano-optics and LED production; and causing optical defects in high energy UV optics.
The advantages of continuous monitoring with laser particle counters will be discussed. Davis will include multiple examples of particle excursions in the optics industry that have been found and fixed, illustrating the types of improvements that can be made through contamination control.
John Davis is the Global Applications Engineering Manager at Particle Measuring Systems. In this role he is responsible for working with customers to provide contamination monitoring solutions. Prior to Particle Measuring Systems, Davis worked for several years as a product manager of thin film optical coating manufacturing equipment. Davis has an MS in Mechanical Engineering and an MBA.
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MARK YOUR CALENDAR
Date: Tue, Aug 23, 2016
Time: 12:00 PM - 1:00 PM EDT
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Space is limited. Reserve your Webinar seat now at:
https://attendee.gotowebinar.com/register/5417105049790059524
After registering you will receive a confirmation email containing information about joining the Webinar.
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SYSTEM REQUIREMENTS
PC-based attendees
Required: Windows® 8, 7, Vista, XP or 2003 Server
Mac®-based attendees
Required: Mac OS® X 10.6 or newer
Mobile attendees
Required: iPhone®, iPad®, Android™ phone or tablet, Windows 8 or Windows Phone 8
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https://photonics.com/Webinars.aspx
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