Microscopy

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MultiMode 8-HR
Bruker Nano Surfaces

Category: Microscopy / Microscope Systems
Type: Scanning Probe
Imaging Noise Level: <30 pm rms
Maximum Sample Size: 15 mm dia × 5 mm thick

Innova
Bruker Nano Surfaces

Category: Microscopy / Microscope Systems
Type: Scanning Probe
Closed-Loop, Large-Area Scanner: XY >90 µm, Z >7.5 µm
Open-Loop, Small-Area Scanner: XY >5 µm, Z >1.5 µm
Sample Size: 45 mm × 45 mm x 18 mm

Dimension FastScan
Bruker Nano Surfaces

Category: Microscopy / Microscope Systems
Type: Scanning Probe
Integral Nonlinearity XYZ: <0.50%
X-Y Scan Range: 90 μm × 90 μm typical
Z Range: 10 μm typical in imaging

Ultima Multiphoton
Bruker Nano Surfaces

Category: Microscopy / Microscope Systems
Type: Scanning Probe
Scan Size: 64 x 64 to 2048 x 2048
Scanning Method: Pair of 6mm galvanometers

Dimension Icon
Bruker Nano Surfaces

Category: Microscopy / Microscope Systems
Type: Scanning Probe
Integral nonlinearity XYZ: <0.5% typical
X-Y scan range: 90 μm x 90 μm typical
Z range: 10 μm typical in imaging

Tungsten Filament Scanning Electron Microscope SEM3200
CIQTEK Co. Ltd.

Category: Microscopy / Microscope Systems
Type: Electron
Acceleration Voltage: 0.2-30 kV
Extension: SE\BSE\EDS\EDX\EBSD, etc.
Low Vacuum Mode: 3 nm @ 30 kV (SE)

FESEM Field Emission Scanning Electron Microscope SEM5000Pro
CIQTEK Co. Ltd.

Category: Microscopy / Microscope Systems
Type: Electron
Acceleration Voltage: 0.02 ~ 30 kV
Electron Gun: High-brightness Schottky
Magnification: 1 ~ 2,500,000 ×

Active Cantilever Scanning Microscope
Seiwa Optical America Inc.

Category: Microscopy / Microscope Systems
Type: Scanning Probe

Microscopy Products

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