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Key Suppliers
Prior Scientific Inc.
Andor Technology
Bruker Nano Surfaces
Applied Scientific Instrumentation Inc.
Zygo Corporation
Photon etc.
DRS Daylight Solutions Inc.
Sutter Instrument Company
13 products
Microscope Systems
Clear All Filters x
nano optics x
Microscopy x
Microscope Systems x
NewView 3D Optical Profiler
Zygo Corporation
Type:
Optical
Spectral Range:
VIS
Compass™ 2
Zygo Corporation
Type:
Optical
Spectral Range:
VIS
ZeGage™ Pro
Zygo Corporation
Type:
Optical
Spectral Range:
VIS
Nexview™ NX2 3D Optical Profiler
Zygo Corporation
Type:
Optical
Spectral Range:
VIS
Contour Elite I
Bruker Nano Surfaces
Type:
Optical
Magnification:
115X
Max Scan:
73 μm / sec
Max Scan Range:
≤10mm
Sample Height:
Up to 100 mm (4 in.)
JPK NanoWizard AFMs
Bruker Nano Surfaces
Type:
Scanning Probe
NPFLEX
Bruker Nano Surfaces
Type:
Optical
Magnification:
115X
Optical Resolution:
0.33 µm
RMS Reapeatability:
0.004 nm
Vertical Resolution:
<0.1 nm
DektakXT
Bruker Nano Surfaces
Type:
Optical
Data Points Per Scan:
120,000 max.
Stylus Force:
1 to 15 mg with LIS 3 sensor
Vertical Range:
1 mm
Dektak XTL
Bruker Nano Surfaces
Type:
Optical
Stylus Force:
0.03 mg to 15 mg
Vertical Range:
1 mm
Vertical Resolution:
1Å max. (@6.55 µm range)
Contour Elite K
Bruker Nano Surfaces
Type:
Optical
Magnification:
115X
Max Scan:
47 μm/sec
Max Scan Range:
>10 mm
Sample Height:
Up to 100 mm
aplanoXX
AdlOptica GmbH
Type:
Optical
Magnification:
20X
Spectral Range:
VIS,NIR
Aberration Correction:
Collar
Clear Aperture:
20 mm
NA:
0.8
Active Cantilever Scanning Microscope
Seiwa Optical America Inc.
Type:
Scanning Probe
Model 4200M
Hinalea Imaging
Type:
Optical
Spectral Range:
VIS,NIR
Number of Spectral Bands:
300 nominal, 600 maximum
Sensor Spatial Resolution:
2.3
Spectral Range:
4-0 - 1,000 nm
Microscope Systems Products
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