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Andor Technology
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MultiMode 8-HR
Bruker Nano Surfaces
Type:
Scanning Probe
Imaging Noise Level:
<30 pm rms
Maximum Sample Size:
15 mm dia × 5 mm thick
JPK NanoWizard AFMs
Bruker Nano Surfaces
Type:
Scanning Probe
Innova
Bruker Nano Surfaces
Type:
Scanning Probe
Closed-Loop, Large-Area Scanner:
XY >90 µm, Z >7.5 µm
Open-Loop, Small-Area Scanner:
XY >5 µm, Z >1.5 µm
Sample Size:
45 mm × 45 mm x 18 mm
Dimension FastScan Bio
Bruker Nano Surfaces
Type:
Scanning Probe
Sample Environment — Flow Cell:
60 μL
X-Y Tip-Velocity Max.:
>2 mm/s
Z Range:
≥3 μm
Dimension FastScan
Bruker Nano Surfaces
Type:
Scanning Probe
Integral Nonlinearity XYZ:
<0.50%
X-Y Scan Range:
90 μm × 90 μm typical
Z Range:
10 μm typical in imaging
Dimension Edge
Bruker Nano Surfaces
Type:
Scanning Probe
X-Y Scan Range:
85 μm minimum
Z Range:
9.5 μm minimum
Ultima Multiphoton
Bruker Nano Surfaces
Type:
Scanning Probe
Scan Size:
64 x 64 to 2048 x 2048
Scanning Method:
Pair of 6mm galvanometers
Dimension Icon
Bruker Nano Surfaces
Type:
Scanning Probe
Integral nonlinearity XYZ:
<0.5% typical
X-Y scan range:
90 μm x 90 μm typical
Z range:
10 μm typical in imaging
Tungsten Filament Scanning Electron Microscope SEM3200
CIQTEK Co. Ltd.
Type:
Electron
Acceleration Voltage:
0.2-30 kV
Extension:
SE\BSE\EDS\EDX\EBSD, etc.
Low Vacuum Mode:
3 nm @ 30 kV (SE)
FESEM Field Emission Scanning Electron Microscope SEM5000Pro
CIQTEK Co. Ltd.
Type:
Electron
Acceleration Voltage:
0.02 ~ 30 kV
Electron Gun:
High-brightness Schottky
Magnification:
1 ~ 2,500,000 ×
Active Cantilever Scanning Microscope
Seiwa Optical America Inc.
Type:
Scanning Probe
Microscope Systems Products
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