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Lambda Research Optics, Inc. - DFO
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CASTECH INC - High Precision CNC Polished Aspherical Lenses
Meadowlark Optics - Wave Plates 6/24 MR 2024
18 suppliers

Other Interferometers

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AOM - Arizona Optical Metrology
AOM - Arizona Optical Metrology - Tucson, AZ
Provides measurement solutions for optical surfaces and systems. Custom metrology for measuring surface figure error, precision alignment, and transmitted wavefront error. Products include computer-generated holograms (CGHs) for interferometric measurement of aspheric and freeform surfaces, mechanics, and accessories for enabling CGH measurements.
Custom ManufacturerSupplier/DistributorDesigner
4 products
Bruker Nano Surfaces
Bruker Nano Surfaces - Tucson, AZ
Extensive suite of application-focused instrumentation for life sciences and materials research and production covers the full range of metrology techniques, sample sizes, and imaging resolutions. Technologies include AFMs, NanoIR spectrometers, fluorescence microscopes, stylus and optical profilers, mechanical testers, and nano-indenters.
Supplier/Distributor
13 products
Data-Pixel - Chavanod, France
Difrotec OU - Tartu, Estonia
Imagine Optic - Orsay, France
Interferometric Optics - Jonesborough, TN
Kohzu Precision Co. Ltd. - Kawasaki, Japan
Metrology Concepts - Rochester, NY
NIREOS - Milan, Italy
nortus Optronic GmbH - Woerth am Rhein, Germany
Opt-E - Tucson, AZ
Optical Measurement Systems Corp. - Laguna Hills, CA
Optocraft GmbH - Erlangen, Germany
QED Technologies Inc. - Rochester, NY
Stanford Photo-Thermal Solutions - Pahoa, HI
TOPTICA Photonics Inc. - Pittsford, NY
Verity Instruments Inc. - Carrollton, TX
Wyse Light - Saint-Etienne, France
Glossary
  • interferometer An interferometer is a scientific instrument that utilizes the principle of interference to measure differences in the path length, wavelength, phase, or amplitude of coherent electromagnetic waves. It typically consists of components such as a...
  • surface profile A representation of the shape of a surface, including any roughness or other irregularities. The profile can be generated by direct measurements, as by a stylus, or by remote measurement, as by an interferometer.
Other Interferometers Suppliersinterferometerslaser interferometerssurface profilinglummer gehrcke platessurface measurementoptical surface measurementinterference of light waveswavefront sensingopticstest & measurement

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