PI Physik Instrumente - Microscope Stages LB ROS 11/24

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Opto Diode Corp. - Detector Spotlight 10-24 MR

Zurich Instruments AG - Challenge Us 10/24 HP

43 products

Other Spectroscopy Products

Clear All Filters x Spectroscopy x Other Spectroscopy Products x

Custom Spectroscopy Lenses
OSE Optics

Type: Component

Transflection Fiber Optic Probe
art photonics GmbH

Type: Equipment
Transmission Range (UV-VIS): 0.25 - 1.15 µm
Transmission Range (VIS-NIR): 0.400 - 2.2 µm

Reflection & Fluorescence Fiber Optic Probes
art photonics GmbH

Type: Equipment
Operating Temperature: -70 °C to +200 °C
Pressure: 10 Bar
Wavelength Range (UV/VIS): 190-1300 nm

ATR Probes for FTIR Process Spectroscopy
art photonics GmbH

Type: Equipment
1.1 to 17: µ
-150 to +250: °C
6.3 mm to 12 mm: DIA

Ruled and Holographic Gratings
Omega Optical - Gratings Products

Type: Component

MicroPL
Edinburgh Instruments Ltd.

Type: Equipment
Excitation / Emission Range: 360 nm – 850 nm (std)
Excitation Modes: Widefield
Objective Magnification: from 5× to 100×

ZEISS Optical Gratings
Carl Zeiss Spectroscopy GmbH

Type: Component
Groove density: 22 – 3600 l/mm
Radius of curvature: plane or 50 – 1000 mm
Spectral range: 120 nm – 20 µm

ZEISS Spectrometer Modules
Carl Zeiss Spectroscopy GmbH

Type: System
Integration time: > 1.1 ms
Numerical aperture: 0.22
Resolution (FWHM): 3 nm

DeepUV Gratings
Omega Optical - Gratings Products

Type: Component
Size: 4×4mm - 30×30mm
UV Performance Range: 190 - 400 nm

ATR Fiber Probe for hazardous environments
art photonics GmbH

Type: Component
Industrial application: 12 mm diam shaft
Lab application: 6 m diam shaft

Mini-Chrom Monochromator
Omega Optical - Gratings Products

Type: Equipment
f Number: 3.9
Focal Length: 74 mm
Operating Temperature: -20 °C to +80 °C

Multi-Application Modular Manufacturing Test System
Yokogawa Test&Measurement

Type: Equipment
Auto-measurements: With Macro Programming
Hot-swapping Capable: Easier Configuration
Multi-user Function: <5 Users Simultaneously

CRDS Mirrors
LohnStar Optics Inc.

Type: Component

Entrance Slits
Graticules Optics Ltd.

Type: Component
Electroplated: >10 µm

Glacier X
m-oem

Type: Component
Filter Type: LVF (Long)
Grating: 700/530
Slit Width: 25 µm slit

Quest X
m-oem

Type: Component
Filter Type: LVF (Long)
Grating: Ruled, 600/400
Slit Width: 25 µm slit

Exemplar Plus
m-oem

Type: Component
Filter Type: LVF (Long)
Grating: Ruled, 300/280
Slit Width: 25 µm slit

Exemplar T
m-oem

Type: Component

Fixed Grating Spectrograph
HORIBA

Type: Equipment

Scanning System
Projectina AG

Type: Equipment

ProbePro Mini
Timegate Instruments Ltd.

Type: Equipment
Diameter: 35 mm
Length: 175 mm

Microprobe
Timegate Instruments Ltd.

Type: Equipment

SampleCube
Timegate Instruments Ltd.

Type: Equipment

VeeMAX III
PIKE Technologies Inc.

Type: Equipment

10Spec
PIKE Technologies Inc.

Type: Equipment

Mid-IR IntegratIR
PIKE Technologies Inc.

Type: Equipment

Laboratory Instruments - mills, grinders
Fritsch GmbH - Milling and Sizing

Type: Equipment

SERS Substrates
Amerigo Scientific

Type: Component

XperRF
Nanobase Inc.

Type: System

V/VX2740 Waveform Digitizer
CAEN Spa

Type: Equipment
Bin Resolution: 16 bit
ENOB: 11.7 (Typ)
FPGA: Open

XperRAM S Series
Nanobase Inc.

Type: System
Active Pixels (detector): 2000 × 256 pixels
Raman Peak Efficiency: ≥ 90%
Scanning Positioning Accuracy: ≤ 1µm

IRis-Core
IRsweep

Type: System
Center Wave Numbers: 2200 cm-1 (4.5µm) - 900 cm-1 (11.1 µm)
Optical Power: 20 mW - 300 mW
Spectral Resolution: <10 MHz (0.0003 cm-1)

IRcell-S - Multipass Absorption Cell
IRsweep

Type: Equipment
Internal Volume: 31 ml
Mirror Design: Single Piece
Path Length: 4.03 m

Portable Raman System
Technospex Pte. Ltd.

Type: System

SphereSpectro 150H
Gigahertz-Optik Inc.

Type: System

microDXP
XIA LLC

Type: Component
Dimensions: 54W×86L×5H

Mercury
XIA LLC

Type: Component
Meas. Type: Fluorescence

DWS RheoLab
LS Instruments AG

Type: Equipment
Complex Modulus G*: 1-50 kPa
Frequency: 0.1 Hz-10 MHz
Sample Volume: 150-1500 uL

NanoLab
LS Instruments AG

Type: Equipment
Excitation Wavelength: 685 nm
Sample Volume: 50-2000 uL
Scattering Angle: 90°

XLNCE SMX-BEN XRF Analyzer
EDAX Inc., Corporate Headquarters

Type: Equipment
Meas. Technique: Fluorescence

Orbis Micro-XRF Elemental Analyzer
EDAX Inc., Corporate Headquarters

Type: Equipment

SimpleTau
Becker & Hickl GmbH

Type: System

WaveCapture FBG Analyzer System
BaySpec Inc.

Type: System
Channel Number: 1 or 4
Frequency Response Time: up to 5 kHz
Readout Resolution: 1 pm

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