Search
Menu
Excelitas Technologies Corp. - X-Cite Vitae LB 11/24
Photonics ProductsSpectroscopyOther Spectroscopy ProductsEquipment

XLNCE SMX-BEN XRF Analyzer


An XRF metrology tool that provides non-destructive analysis for composition and coating thickness measurement of single and multi-layered materials up to 30 elements, ranging from less than a nanometer to microns, quickly and accurately on virtually any substrate.
XLNCE SMX-BEN XRF Analyzer

EDAX Inc., Corporate Headquarters
5794 W Las Positas Blvd.
Pleasanton, CA 94588
United States
Phone: +1 201-529-4880
Fax: +1 201-529-3156
Toll-free: +1 800-535-3329
We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.