An XRF metrology tool that provides non-destructive analysis for composition and coating thickness measurement of single and multi-layered materials up to 30 elements, ranging from less than a nanometer to microns, quickly and accurately on virtually any substrate.
5794 W Las Positas Blvd.
Pleasanton, CA 94588
United States
Phone: +1 201-529-4880
Fax: +1 201-529-3156
Toll-free: +1 800-535-3329