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< Spectroscopy
Other Spectroscopy Products
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Key Suppliers
Gigahertz-Optik Inc.
Mightex Systems
Edinburgh Instruments Ltd.
art photonics GmbH
BaySpec Inc.
Graticules Optics Ltd.
OSE Optics
44 products
Other Spectroscopy Products
Compare 44 products from verified Other Spectroscopy Products suppliers in our comprehensive photonics marketplace.
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Spectroscopy x
Other Spectroscopy Products x
Entrance Slits
Graticules Optics Ltd.
Type:
Component
Electroplated:
>10 µm
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ATR Fiber Probe for hazardous environments
art photonics GmbH
Type:
Component
Industrial application:
12 mm diam shaft
Lab application:
6 m diam shaft
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Transflection Fiber Optic Probe
art photonics GmbH
Type:
Equipment
Transmission Range (UV-VIS):
0.25 - 1.15 µm
Transmission Range (VIS-NIR):
0.400 - 2.2 µm
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ATR Probes for FTIR Process Spectroscopy
art photonics GmbH
Type:
Equipment
1.1 to 17:
µ
-150 to +250:
°C
6.3 mm to 12 mm:
DIA
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Reflection Fiber Optic Probes
art photonics GmbH
Type:
Equipment
Operating Temperature:
-70 °C to +200 °C
Pressure:
10 Bar
Wavelength Range (UV/VIS):
190-1300 nm
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BTS2048-WP
Gigahertz-Optik Inc.
Type:
System
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LCRT-2005H-S
Gigahertz-Optik Inc.
Type:
System
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SphereSpectro 150H
Gigahertz-Optik Inc.
Type:
System
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Optical Spectrometer Sensor Engine
Mightex Systems
Type:
Component
WaveCapture FBG Analyzer System
BaySpec Inc.
Type:
System
Channel Number:
1 or 4
Frequency Response Time:
up to 5 kHz
Readout Resolution:
1 pm
MicroPL
Edinburgh Instruments Ltd.
Type:
Equipment
Excitation / Emission Range:
360 nm – 850 nm (std)
Excitation Modes:
Widefield
Objective Magnification:
from 5× to 100×
Custom Spectroscopy Lenses
OSE Optics
Type:
Component
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PROGAZE SSE - Smart Spectrometer Electronics
tec5 AG
Type:
Component
Quest X
m-oem, OEM Components
Type:
Component
Filter Type:
LVF (Long)
Grating:
Ruled, 600/400
Slit Width:
25 µm slit
Exemplar Plus
m-oem, OEM Components
Type:
Component
Filter Type:
LVF (Long)
Grating:
Ruled, 300/280
Slit Width:
25 µm slit
Glacier X
m-oem, OEM Components
Type:
Component
Filter Type:
LVF (Long)
Grating:
700/530
Slit Width:
25 µm slit
Exemplar T
m-oem, OEM Components
Type:
Component
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TinyHawk - oil leak detector
LDI Innovation OU
Type:
Equipment
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H2B-Spectral
LDI Innovation OU
Type:
Equipment
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BlueHawk - Oil spill sensor
LDI Innovation OU
Type:
Equipment
Multi-Application Modular Manufacturing Test System
Yokogawa Test&Measurement
Type:
Equipment
Auto-measurements:
With Macro Programming
Hot-swapping Capable:
Easier Configuration
Multi-user Function:
<5 Users Simultaneously
CRDS Mirrors
LohnStar Optics Inc.
Type:
Component
ZEISS Optical Gratings
Carl Zeiss Spectroscopy GmbH
Type:
Component
Groove density:
22 – 3600 l/mm
Radius of curvature:
plane or 50 – 1000 mm
Spectral range:
120 nm – 20 µm
ZEISS Spectrometer Modules
Carl Zeiss Spectroscopy GmbH
Type:
System
Integration time:
> 1.1 ms
Numerical aperture:
0.22
Resolution (FWHM):
3 nm
Fixed Grating Spectrograph
HORIBA
Type:
Equipment
Scanning System
Projectina AG
Type:
Equipment
ProbePro Mini
Timegate Instruments Ltd.
Type:
Equipment
Diameter:
35 mm
Length:
175 mm
Microprobe
Timegate Instruments Ltd.
Type:
Equipment
SampleCube
Timegate Instruments Ltd.
Type:
Equipment
VeeMAX III
PIKE Technologies Inc.
Type:
Equipment
10Spec
PIKE Technologies Inc.
Type:
Equipment
Mid-IR IntegratIR
PIKE Technologies Inc.
Type:
Equipment
Laboratory Instruments - mills, grinders
Fritsch GmbH - Milling and Sizing
Type:
Equipment
SERS Substrates
Amerigo Scientific
Type:
Component
XperRF
Nanobase Inc.
Type:
System
V/VX2740 Waveform Digitizer
CAEN Spa
Type:
Equipment
Bin Resolution:
16 bit
ENOB:
11.7 (Typ)
FPGA:
Open
XperRAM S Series
Nanobase Inc.
Type:
System
Active Pixels (detector):
2000 × 256 pixels
Raman Peak Efficiency:
≥ 90%
Scanning Positioning Accuracy:
≤ 1µm
microDXP
XIA LLC
Type:
Component
Dimensions:
54W×86L×5H
Mercury
XIA LLC
Type:
Component
Meas. Type:
Fluorescence
DWS RheoLab
LS Instruments AG
Type:
Equipment
Complex Modulus G*:
1-50 kPa
Frequency:
0.1 Hz-10 MHz
Sample Volume:
150-1500 uL
NanoLab
LS Instruments AG
Type:
Equipment
Excitation Wavelength:
685 nm
Sample Volume:
50-2000 uL
Scattering Angle:
90°
XLNCE SMX-BEN XRF Analyzer
EDAX Inc., Corporate Headquarters
Type:
Equipment
Meas. Technique:
Fluorescence
Orbis Micro-XRF Elemental Analyzer
EDAX Inc., Corporate Headquarters
Type:
Equipment
SimpleTau
Becker & Hickl GmbH
Type:
System
Other Spectroscopy Products
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