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Photonics Products Spectroscopy Other Spectroscopy Products Equipment

XLNCE SMX-BEN XRF Analyzer

Name: XLNCE SMX-BEN XRF Analyzer
Rating: 5 (1 reviews)

About EDAX Inc., Corporate Headquarters

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Type: Equipment
Meas. Technique: Fluorescence

An XRF metrology tool that provides non-destructive analysis for composition and coating thickness measurement of single and multi-layered materials up to 30 elements, ranging from less than a nanometer to microns, quickly and accurately on virtually any substrate.

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