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Vistec Semiconductor Systems Is Launched

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Vistec Semiconductor Systems GmbH of Wetzlar, Germany, unveiled its new corporate identity, including its new name and logo, at the Semicon Europe show in Munich, Germany, in April. Formerly known as Leica Microsystems, Semiconductor Equipment Div., the company was acquired by Golden Gate Capital of San Francisco in September 2005.

Vistec’s portfolio includes mask metrology and electron beam lithography systems as well as inspection and review systems for the process control of wafers. The name change reflects the company’s goal to develop new and future-oriented technologies.
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Published: June 2006
Glossary
metrology
Metrology is the science and practice of measurement. It encompasses the theoretical and practical aspects of measurement, including the development of measurement standards, techniques, and instruments, as well as the application of measurement principles in various fields. The primary objectives of metrology are to ensure accuracy, reliability, and consistency in measurements and to establish traceability to recognized standards. Metrology plays a crucial role in science, industry,...
Businesselectron beam lithography systemsindustriallight speedmask metrologymetrologyVistec Semiconductor Systems GmbH

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