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Quantum Dot Microscope Can Measure Electric Surface Potentials of Single Atoms

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JÜLICH, Germany, June 18, 2019 — A new scanning quantum dot microscopy method can measure the electric potential of a sample at atomic accuracy. It was developed by a team from Forschungszentrum Jülich, working with researchers from two other institutions. The new technique has potential application for chip manufacturing and the characterization of biomolecules. A quantum dot was attached to the tip of an atomic force microscope (AFM) to serve as a noncontact scanning probe. The quantum dot was so small that individual electrons from the tip of the AFM could be attached to it in a controlled manner. The quantum...Read full article

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    Published: June 2019
    Glossary
    quantum dots
    A quantum dot is a nanoscale semiconductor structure, typically composed of materials like cadmium selenide or indium arsenide, that exhibits unique quantum mechanical properties. These properties arise from the confinement of electrons within the dot, leading to discrete energy levels, or "quantization" of energy, similar to the behavior of individual atoms or molecules. Quantum dots have a size on the order of a few nanometers and can emit or absorb photons (light) with precise wavelengths,...
    nano
    An SI prefix meaning one billionth (10-9). Nano can also be used to indicate the study of atoms, molecules and other structures and particles on the nanometer scale. Nano-optics (also referred to as nanophotonics), for example, is the study of how light and light-matter interactions behave on the nanometer scale. See nanophotonics.
    scanning tunneling microscope
    A high-resolution imaging instrument that can detect and measure the positions of individual atoms on the surface of a material. A very fine conductive probe is placed at a distance of 10 to 20 Å above the surface of a conductive sample, and a bias voltage is applied between probe and surface during scanning, creating overlapping electron clouds and electrons that tunnel between the potential barrier between the probe and the sample. The probe tip is maintained at a constant distance from...
    Research & TechnologyeducationEuropeImagingimaging techniquesMaterialsMicroscopyatomic force microscopyquantum dotsLight SourcesSensors & DetectorsBiophotonicssemiconductorsnanonanostructuresscanning tunneling microscopeTest & Measurement

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