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Opto Diode Corp. - Opto Diode 10-24 LB

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Using Interferometry for Quality Monitoring

David Page and Ian Routledge

Interferometry is a routine quality- monitoring test for optical components and systems at wavelengths ranging from the visible to above 10 µm. The technique has been available in commercial tools since the early 1970s, and a number of manufacturers have ensured that instruments have incorporated the latest developments as the technology has evolved.

The visible region and infrared wavebands (mainly 3 to 5 µm and 8 to 12 µm) form a natural division in the field…
Excelitas Technologies Corp. - X-Cite Vitae  MR 11/24

Published: November 2001
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