Nova Measuring Instruments Restructures Management Team

Nova Measuring Instruments Ltd. of Rehovoth, Israel, a maker of integrated process control systems for semiconductor manufacturing, today said it has changed its management team and reorganized the company into business units as part of its effort to integrate the operations of recently acquired HyperNex, a manufacturer of production microstructure metrology tools for advanced semiconductor fabs. Nova said that Avron Ger has been promoted to vice president of the Thin Film Business Unit. Ger, a 10-year company veteran, most recently headed Nova's MARS modeling software for optical CD measurement. Dave Kurtz, formerly CEO of HyperNex, was named vice president of the Microstructure Business Unit. Kurtz has 23 years of industrial and semiconductor materials processing experience and spent 12 years with ATMI, where he held several positions including management of advanced development group in thin-film processing. Avi Magid, who recently joined Nova after 13 years with semiconductor assembly equipment supplier Kulicke & Soffa Industries, is now executive vice president, Global Business Management Group. Boaz Brill is now vice president technology development, heading Nova's Technology Development Group. Brill has been with Nova since 1999, was the lead scientist on the company's entry into the optical CD market and developed the NovaScan 3090 platform. He most recently headed Nova's physics department. David Scheiner is now chief technology officer, replacing Moshe Finarov, one of Nova's founders. Scheiner, an expert in semiconductor processes and a metrology scientist, joined Nova in 1996. He founded the physics and applications departments and has headed Nova's Research and Development Group. Gabi Sharon, an 11-year company veteran, is now vice president operations, heading the Operations Group.

Meadowlark Optics - Wave Plates 6/24 MR 2024

Published: November 2006

Glossary

metrology: Metrology is the science and practice of measurement. It encompasses the theoretical and practical aspects of measurement, including the development of measurement standards, techniques, and instruments, as well as the application of measurement principles in various fields. The primary objectives of metrology are to ensure accuracy, reliability, and consistency in measurements and to establish traceability to recognized standards. Metrology plays a crucial role in science, industry,...
nano: An SI prefix meaning one billionth (10-9). Nano can also be used to indicate the study of atoms, molecules and other structures and particles on the nanometer scale. Nano-optics (also referred to as nanophotonics), for example, is the study of how light and light-matter interactions behave on the nanometer scale. See nanophotonics.
photonics: The technology of generating and harnessing light and other forms of radiant energy whose quantum unit is the photon. The science includes light emission, transmission, deflection, amplification and detection by optical components and instruments, lasers and other light sources, fiber optics, electro-optical instrumentation, related hardware and electronics, and sophisticated systems. The range of applications of photonics extends from energy generation to detection to communications and...
thin film: A thin layer of a substance deposited on an insulating base in a vacuum by a microelectronic process. Thin films are most commonly used for antireflection, achromatic beamsplitters, color filters, narrow passband filters, semitransparent mirrors, heat control filters, high reflectivity mirrors, polarizers and reflection filters.

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