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Excelitas Technologies Corp. - X-Cite Vitae LB 11/24

Imtec Forms Semiconductor Unit

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Wet-processing module developer Imtec Acculine Inc. has formed a new business unit, Imtec Legacy Systems, for semiconductor equipment.

The new venture will be focused on the sales, refurbishment and service of semiconductor front-end equipment, as well as providing hard-to-find spare parts. Imtec will specialize in Gasonics and KLA tools, but will have the ability to work on ashers, etchers and other dry process and metrology tools.

Lee Stevens will be managing sales and overseeing operations for the unit. Stevens has been working with semiconductor front-end equipment since 1979 and was operations manager at Surplus Process Equipment Corp. since 2010.

Imtec has dedicated 2,500 sq ft inside its Fremont facility for the refurbishment and testing of surplus equipment. The new area will have space and facilities for working on multiple tools in a clean room environment.

“We see the support of Legacy equipment as being vital to the industry and a natural complement to our wet process modules business,” said Paul Mendes, president of Imtec. “We believe this diversification will benefit our customer base and provide a platform for growth.”

Imtec is a manufacturer of high-purity chemical processing equipment, megasonic systems, heated process tanks, in-line heaters and UV light shields.
Excelitas PCO GmbH - PCO.Edge 11-24 BIO MR

Published: December 2016
Glossary
metrology
Metrology is the science and practice of measurement. It encompasses the theoretical and practical aspects of measurement, including the development of measurement standards, techniques, and instruments, as well as the application of measurement principles in various fields. The primary objectives of metrology are to ensure accuracy, reliability, and consistency in measurements and to establish traceability to recognized standards. Metrology plays a crucial role in science, industry,...
Imtec AcculineImtec Legacy SystemssemiconductorsAmericasBusinessindustrialLight Sourcesmetrology

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