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EM Optomechanical Inc., an Albequerque, N.M., manufacturer of a 3-D MEMS (microelectromechanical systems) profiler -- a metrology instrument based on long working-distance interference microscope technology -- has delivered its first profiler to Auburn University's college of engineering. The OPTOPro Model 622A, intended for microsystems researchers, makes real-time dynamic measurements of the microscale and nanoscale motions of MEMS devices and other microsystems. EM Optomechanical, which spun off from Optomec Inc. in 1998 to provide optomechanical engineering, design and fabrication services to the photonics industry, recently made the transition to a product-oriented company focusing on long-working distance interference microscope technology. . . . Steven Durnil, COO of medical imaging systems maker Fischer Imaging, was named president and CEO of the company. He succeeds Harris Ravine, who resigned as an officer and board member. Ravine will continue to work with the company and the board as a consultant. Durnil, who joined Fischer as vice president of manufacturing and supply chain in 2004, will retain his COO responsibilities. The company is undergoing a transition after the recent sale of its mammography business intellectual property to Hologic Inc. . . . Jeffry W. Raynes was named the new executive director of the Institute of Electrical and Electronics Engineers Inc. (IEEE), effective in November. He succeeds former IEEE executive director Daniel J. Senese, who retired in December. Raynes, who will serve as COO and will manage the IEEE's 900 employees in the US and overseas, was formerly executive director and COO of the Association for Operations Management. Previously, he was executive vice president and CEO of the North American Die Casting Association, president and CEO of the Better Home Heat Council of Boston and director of marketing for Association Management Corp., based in Springfield, N.J.
Excelitas Technologies Corp. - X-Cite Vitae  MR 11/24

Published: July 2005
Glossary
metrology
Metrology is the science and practice of measurement. It encompasses the theoretical and practical aspects of measurement, including the development of measurement standards, techniques, and instruments, as well as the application of measurement principles in various fields. The primary objectives of metrology are to ensure accuracy, reliability, and consistency in measurements and to establish traceability to recognized standards. Metrology plays a crucial role in science, industry,...
Auburn UniversityEM OptomechanicalIEEEindustriallong working-distance interference microscopeMEMSmetrologyMicroscopyNews BriefsPhotonics Tech Briefs

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