Suss MicroTec AG of Munich, Germany, and LNL Technologies Inc. of Cambridge, Mass., have agreed to market and sell LNL's optical probe technology. Integrated with a Suss probe system, the technology enables producers of edge devices such as arrayed-waveguide gratings, lasers and detectors to determine working die or "known good die" at the wafer level. It reduces the processing time lost on nonworking die, driving down the cost of testing and manufacturing. The on-wafer system enables die testing between processing steps and allows each optical function on a die to be tested individually.