Search
Menu
Hamamatsu Corp. - Mid-Infrared LED 11/24 LB

Industrial Equipment Failure Analysis Using FT-IR Microscopic Techniques

Facebook X LinkedIn Email
Wednesday, May 12, 2021
PerkinElmer (See Revvity)

This work demonstrates that FT-IR microscopy analysis is capable of determining the cause of failures of many different pieces of industrial equipment. This analysis can then allow the user to take preventative action measures in order to improve the reliability of the system and minimize future failures.

Download Application Note
File: Industrial_Equipment_Failure_AnalysisApp_Note.pdf (2.57 MB)
To download this application note, please complete the *required fields before clicking the "Download" button.
Your contact information
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:




When you click "Download", you agree that your personal contact information may be shared with PerkinElmer (See Revvity) and they may contact you about their products and services in the future. You also agree that Photonics Media may contact you with information related to this request, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.

Register or login to auto-populate this form:
Login Register
* Required
microscopes & accessoriesmaterials researchMicroscopyspectroscopyindustrial equipmentfailure analysisFT-IR
We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.