Sheetak - Cooling at your Fingertip 11/24 LB

view all white papers and application notes

Extreme Metrology: Big Science Requires a Nano-perspective

Author: James F. MacKay
Wednesday, August 19, 2020
Mad City Labs Inc.

Extreme metrology represents the cutting edge in technological demand from the material researchers, astronomers, and other physicists whose work demands nearly unattainable precision. Understanding the metrology loop means understanding not just the end goal in terms of metrology but also realizing how much (and to what extent) each component influences the activity in terms of stability, resolution, and ability to move an object at that level.

Download

Download White Paper

File: Extreme_metrology.pdf (116.70 KB)
To download this white paper, please complete the *required fields before clicking the "Download" button.

Your contact information

* First Name:

* Last Name:

* Email Address:

* Company:

* Country:

When you click "Download", you agree that your personal contact information may be shared with Mad City Labs Inc. and they may contact you about their products and services in the future. You also agree that Photonics Media may contact you with information related to this request, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.

* Required

Similar White Papers and Application Notes

Positioning at the Nanoscale (and Below): Trust in Proven Performance

Through a deep knowledge of sensing technologies, technically adept personnel, and experience across applications as diverse as astronomy to live cell imaging, Mad City Labs helps our customers...

10/19/2022

- Mad City Labs Inc.

Custom vs. Off-the-Shelf Solutions: Are you dreaming big enough?

Custom positioning solutions provide more leeway for innovation, and at far less cost, than many customers realize. Irrespective of whether the goal is a one-off solution or multiple units for a...

2/25/2020

- Mad City Labs Inc.

Resonant Probe AFM: Uses and Advantages

A resonant probe atomic force microscope (AFM) offers capabilities and benefits not found in commonly used optical deflection AFMs in the measurement of physical constants, physical properties, and...

7/3/2023

- Mad City Labs Inc.

Imaging components & systemspositioning/vibration-isolation equipmentspectroscopy equipmentmetrologyprecisionpicometernanoradianinspectionastronomyLIGOinterferometryNanopositioningnanopositionerspiezopiezo actuatorclosed loop nanopositioner

November 2024 Subscribe Advertise
Issue Library