Search
Menu
Optimax Systems, Inc. - Ultrafast Coatings 2024 LB
view all white papers and application notes

Asphere Metrology: Options for Measuring Aspheric Lenses

Facebook X LinkedIn Email
Tuesday, January 19, 2010
Optimax Systems Inc.

This paper will outline the numerous metrology options for aspheres at Optimax, including how they work, any requirements, and what is specified with each method in an effort to help reasonably tolerance aspheres. Effects on the fabrication and cost of the lens will also be discussed. Metrology of aspheres fits into three basic categories: physically measuring the form of the optical surface, reflected wavefront testing, and transmitted wavefront testing. Each category has different methods of testing with varying degrees of accuracy.
Download
Optimax Systems Inc.

Download White Paper
File: Asphere_Metrology__Options_for_Measuring_Aspheric_Lenses.pdf (466.94 KB)
To download this white paper, please complete the *required fields before clicking the "Download" button.
Your contact information
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:




When you click "Download", you agree that your personal contact information may be shared with Optimax Systems Inc. and they may contact you about their products and services in the future. You also agree that Photonics Media may contact you with information related to this request, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.

Register or login to auto-populate this form:
Login Register
* Required
Similar White Papers and Application Notes
3 Questions to Ask Before Buying Infrared Interferometry
Important considerations in obtaining infrared optical metrology, for measuring transmitted wavefront error, optical quality, and surface quality. The paper asks questions to help guide the reader in...
6/1/2022
- 4D Technology Corp.
Metrology for the Manufacture of Freeform Optics
Freeform optics are gaining popularity with lens designers and optical system integrators as a method to solve complex optical system design problems. Optimax has developed new freeform manufacturing...
8/1/2018
- Optimax Systems Inc.
Easy to use Computer Generated Holograms for Complex Surface Metrology
There are many metrology methods on the market for testing aspheres. The method with one of the highest known accuracies is based on a Fizeau interferometer, in combination with a CGH. We describe a...
6/1/2021
- DIOPTIC GmbH
aspheresFARO Gage Plusinterferometerslensesmetrologynull testingoptical designOpticsOptimaxprofilometrysubaperture stitching interferometerTalysurfTaylor HobsonTest & Measurementtransmitted wavefront errorTWEVerifire asphere interferometerwavefront testingZygo

Explore Our Content
News
Features
Latest Products
Webinars
White Papers
All Things Photonics Podcast
Photonics Spectra Now
Videos
Our Summits & Conferences
Industry Events
Bookstore
Join Our Community
Subscribe
Advertise
Become a member
Sign in
Contribute a Feature
Suggest a Webinar
Submit a Press Release
Mobile Apps

About Us
Our Company
Our Publications
Contact Us
Career Opportunities
Teddi C. Laurin Scholarship

Terms & Conditions
Privacy Policy
California Consumer Privacy Act (CCPA)



©2024 Photonics Media
100 West St.
Pittsfield, MA, 01201 USA
[email protected]
We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.