About This Webinar
Using SWIR, MIR, and FIR lasers requires knowledge of their beam quality parameters. Many considerations significantly impact the laser process, such as mode structure, positional stability, and propagation characteristics. An understanding of performance qualities can ensure that the user finds successful outcomes and reduces scrap and other unwanted results.
Numerous products and techniques have been developed to enable the measurement of beam quality parameters for long-wavelength light sources. Kevin D. Kirkham presents the types of measurement tools that are available for long-wavelength sources, and he helps determine which tools are appropriate for different application types. These tools include IR cameras, pyroelectric scanning-slit sensors, and wavelength conversion apparatus.
Courtesy of Ophir.
Who should attend:
Engineers and researchers working with laser systems and light sources for test and measurement. Those who utilize these laser systems within fields such as aerospace, automotive, biophotonics, defense, industry, and semiconductors.
About the presenter:
Kevin D. Kirkham is the senior manager of new business development for Ophir at MKS Instruments. He has over 30 years of experience in laser diagnostics and quality assessment. Prior to working at MKS, he was product manager at Coherent Inc. and regional sales manager at Molectron Detector. He can be reached by email at [email protected].
About Ophir:
Ophir is a brand within the MKS Instruments Light & Motion division. The Ophir product portfolio consists of laser and LED measurement products including laser power and energy meters and laser beam profilers measuring femto-watt to hundred-kilowatt lasers. They also offer high-performance IR and visible optical elements, IR thermal imaging lenses and zoom lenses for defense and commercial applications, OEM and replacement high-quality optics and sub-assemblies for CO2, and high-power fiber laser material processing applications.