About This Webinar
SWIR imaging refers to the usage of imaging devices that operate in the wavelength range of 400 to 1700 nanometer light. SWIR sensors take advantage of the unique optical properties of matter in the SWIR continuum to create contrast between objects and to make them transparent. This has several uses in a variety of applications including semiconductor inspection, moisture detection, and surveillance.
The ability of SWIR imaging devices to accomplish these tasks is explained by the imaged material’s absorption spectrum, which is caused by the underlying molecular and electronic structure of that material. Jones explains the mechanisms of common SWIR imaging materials and their broader applications as a result. He also discusses the need for specialized optics for SWIR imaging devices. SWIR imaging technology has opened up new possibilities for a wide range of challenging applications allowing high analysis flexibility and accurate detail recognition.
*** This presentation premiered during the
2023 Vision Spectra Conference. For more information on Photonics Media conferences, visit
events.photonics.com.
About the presenter
Evan C. Jones is an applications engineer for Basler, a manufacturer of industrial machine vision cameras and accessories. Jones graduated from the University of Delaware with a Bachelor of Science in physics, specializing in the study of atomic, molecular, and optical (AMO) systems. He is currently a doctoral student at the University of Delaware focused on AMO physics. He also has obtained the Certified Vision Professional (CVP) certification as of 2022.