About This Webinar
This presentation delves into techniques that overcome the limitations of traditional VIS/SWIR inspection systems. Tu explores designs utilizing multiple sensors and methods to extend wavelength on a single sensor for imaging, spectroscopy, and multispectral/hyperspectral imaging. These advancements enable faster, more compact, and precise inspection processes by capturing comprehensive spectral information and enhancing sensor sensitivity.
*** This presentation premiered during the
2024 Vision Spectra Conference. For more information on Photonics Media conferences and summits, visit
events.photonics.com
About the presenter
Albert Tu is a marketing engineer for Hamamatsu Corporation in Bridgewater, NJ, specializing in NIR applications and image sensors. After graduating from college, he held positions in product design, technical support, and product management in the optical industry. He returned to business school to get his master’s degree from the University of Texas at Austin. With over 10 years of hands-on experience in product development and new technology implementation, he now provides insights to help customers find the right solution for their technology.