MoviTHERM Semiconductor Failure Analysis using Lockin Thermography
MoviTHERM's Semi-CHECK solutions allow the detection of shorts and other defects in semiconductors. This system uses a FLIR Thermal camera with microscopic lens attachment in order to provide the correct magnification. Lockin Thermography allows to detect defects with nano-watt to micro-watt signatures.
FLIR cameraFlir SystemsNDENDTnondestructive testingsemiconductor failure analysisSemiconductor Manufacturing International Corporationsemiconductorinfrared test equipmentinfrared imaging systemlockin thermographythermal microscopy