High Accuracy Optical Metrology for MicroLED Displays and Wafers
From wafer to display: How can optical metrology improve the efficiency of MicroLED manufacturing? In his MicroLED Connect 2025 presentation, Dr. Tobias Steinel presents traceable testing methods based on electroluminescence and photoluminescence. Learn how imaging systems from Instrument Systems deliver fast and reliable measurements from individual µLEDs to complete wafers. Speaker: Dr. Tobias Steinel Duration: 20:48 minutes.