Micro-LED Device Inspection System
Semilab Semiconductor Physics Laboratory Co. Ltd.Request Info
BUDAPEST, Hungary, Dec. 17, 2025 —
LumiPix-3000 from Semilab is a photoluminescence-based inspection system with full wafer imaging capabilities designed for detecting intensity and wavelength defects in micro-LED devices. LumiPix-3000 features multiple excitation options and high-resolution imaging for defect analysis. The system is designed to record, store, and display various measurement data for different micro-LED applications, with support for indium gallium nitirde and aluminum indium gallium phosphide materials on wafers up to 12 in. The system's nondestructive metrology approach enables the identification of various defects, including intensity variations, wavelength shifts, and morphological anomalies.
https://semilab.com
/Buyers-Guide/Semilab-Semiconductor-Physics-Laboratory-Co-Ltd/c18475
Published: December 2025
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