Metrology for Complex 3-D Objects
ASE Optics LLC (See Rochester Precision Optics)Request Info
Ase Optics Inc. has developed a unique non-contact scanning metrology instrument capable of measuring the surface profile and optical thickness of 3-D objects at a spatial resolution of 25 µm and a measurement accuracy of 100 nm.
The instrument features a commercial Lumetrics OptiGauge that utilizes low coherence dual-wavelength interferometry technology originally invented at Eastman Kodak Co. to simultaneously measure the optical thickness of all layers within multilayer materials.
http://www.aseoptics.com
/Buyers_Guide/ASE_Optics_LLC_See_Rochester_Precision_Optics/c1147
Published: May 2007
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