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Stanford Research Systems - Precision DC Voltage 3-25 728x90

MadAFM® Sample Scanning AFM

Mad City Labs Inc.Request Info
 
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MadAFM® Sample Scanning AFMThe MadAFM® is a multimodal sample scanning AFM. Compact with simple user install. Includes Mad City Labs picometer precision nanopositioning systems for outstanding AFM performance. User friendly AFMView® software features automated calibration and initialization. Standard imaging, electrical, mechanical (including nanolithography), magnetic, and force measurement modes.


Published: December 2025




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