FilmTek 2000 PAR-SE Robotic
Bruker Nano SurfacesRequest Info
This best-in class system utilizes
reflectometry and ellipsometry to
provide high-resolution, independent
measurements of film thickness and
refractive index. Patented multi-modal
data collection and modeling return
precision results in seconds — ideal
for inline metrology of ONO stacks,
SiGe, high-k/low-k, and more in
semiconductor, MEMS, and photonics
manufacturing. Integrated software
makes complex wafer analysis intuitive and reliable.
https://www.bruker.com/2000-par-se-robotic
/Buyers-Guide/Bruker-Nano-Surfaces/c19385
Published: October 2025
From the Photonics Marketplace
REQUEST INFO ABOUT THIS PRODUCT
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:
Message:
When you click "Send Request", we will record and send your personal contact information to Bruker Nano Surfaces by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our
Privacy Policy and
Terms and Conditions of Use.
Register or login to auto-populate this form:
Login
Register
* Required