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Photonics Device Probing Test System Model 58635

Request Quote Data Sheet

Company: Chroma ATE Inc.
Type: System
Wafer Size: 2~6 inch
Wafer Thickness: 100~3,000 µm
Wafer Warpage: ≦10 mm
Chip Size: ≧150 µm
Optical Power: 0.1~5,000 mW
Wavelength: 800~1,000 nm

Photonics Device Probing Test System Model 58635

Chroma ATE Inc.

7 Chrysler
Irvine, CA 92618
United States

Phone: +1 949-421-0355
Fax: +1 949-421-0353
Toll-free: +1 800-478-2026

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