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In-Process Wafer Die Inspection System Model 7945

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Company: Chroma ATE Inc.
Type: System
Wafer Size: ≤ 8 inch
Camera: 25M color camera × 2
Magnification: 2×, 5× and 10×
Resolution: 1.28µm/pixel
Power: AC 220V±10%
Operation Temperature: +5˚C ~40˚C

In-Process Wafer Die Inspection System Model 7945

Chroma ATE Inc.

7 Chrysler
Irvine, CA 92618
United States

Phone: +1 949-421-0355
Fax: +1 949-421-0353
Toll-free: +1 800-478-2026

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