PHOTON RT 7512 Spectrophotometer

About EssentOptics Europe UAB

• Type: Benchtop
• Measurement Techniques: Reflectance and Transmission
• Spectral Range (nm): 7500 - 14000
• Max. Resolution (nm): 15
• Width: 760mm
• Length: 380mm
• Height: 350mm
• Applications: Defense, Materials Identification, Scientific Research, Other
• Sample size (max): 150 mm x 200 mm
• Sample thickness (max): 40 mm
• Variable angles of incidence: 0-60 deg
• Polarization: S/P (built-in)
• Beam offset tracking: up to 40 mm
• Ultimate spectral resolution: 15 nm

Accurate characterization of the LWIR optical coatings represent one of the most critical challenges today. Optical manufacturers worldwide are specifying increasingly sophisticated IR coatings for their planar optics, aiming for improved long-distance object detection and identification.

This dispersive spectrophotometer is a purpose-built instrument specifically designed to effectively address these challenges. It measures the transmission and reflection of coatings designed for 7500 - 14000 nm. It has the ability to perform automatic measurements at variable angles of incidence (up to 60 degrees) with polarized light. To support these demanding tests, a built-in feature accurately compensates for beam displacement at high angles, ensuring that S-pol/P-pol measurements are delivered just in a few minutes. Maximum sample thickness can be up to 40 mm.