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XLNCE SMX-BEN XRF Analyzer

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Company: EDAX Inc., Corporate Headquarters
Type: Equipment
Meas. Technique: Fluorescence

An XRF metrology tool that provides non-destructive analysis for composition and coating thickness measurement of single and multi-layered materials up to 30 elements, ranging from less than a nanometer to microns, quickly and accurately on virtually any substrate.

EDAX Inc., Corporate Headquarters

5794 W Las Positas Blvd.
Pleasanton, CA 94588
United States

Phone: +1 201-529-4880
Fax: +1 201-529-3156
Toll-free: +1 800-535-3329

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