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Stanford Research Systems - Precision DC Voltage 3-25 728x90

Photonics Products Spectroscopy Other Spectroscopy Products Equipment

XLNCE SMX-BEN XRF Analyzer

About EDAX Inc., Corporate Headquarters

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Type: Equipment
Meas. Technique: Fluorescence

An XRF metrology tool that provides non-destructive analysis for composition and coating thickness measurement of single and multi-layered materials up to 30 elements, ranging from less than a nanometer to microns, quickly and accurately on virtually any substrate.

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