Key Considerations for Part and Sample Holding in Interferometric Characterization
Wed, Jan 18, 2023 1:00 PM - 2:00 PM EST
Interferometry is a powerful tool when used to characterize optical surface form errors, as well as accumulated errors, when measuring transmitted wavefronts. Opticians and engineers have many methods available to facilitate such measurements but can often overlook the effects caused by part holding or fixturing. Frank DeWitt of XONOX Technology Inc. discusses what should be considered when approaching part holding and fixturing for interferometric measurements, the features that are critical to the item being measured, and the required outputs of the measurement.
3D Optical Metrology: Capabilities for a New Era
Thu, Jan 19, 2023 1:00 PM - 2:00 PM EST
Kevin Harding of Optical Metrology Solutions provides an overview of the many 3D optical metrology tools available today. He discusses applications from general manufacturing of durable parts to precision component measurement. He shares examples, typical performance specifications, and the limitations of the many tools on the market today. Harding then considers each technology for both the type of application it is best suited to address, as well as its speed and resolution. Finally, he shows where each technology fits within the bigger picture of practical applications.
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