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This Week in Photonics: Structural Color Flourishes as Gas Image-Characterization Tool (12/29/2022)

This Week in Photonics: Structural Color Flourishes as Gas Image-Characterization Tool
Weekly newsletter highlighting breaking news, technology developments and product releases in the photonics industry.
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Thursday, December 29, 2022
 
.: Top Stories

 
Device Uses Structural Color to Image-Characterize Ambient Gases
Device Uses Structural Color to Image-Characterize Ambient Gases
Researchers from the National Institute for Materials Science (Japan), Harvard University, and the University of Connecticut jointly designed and fabricated a device for imaging a gas injected into it, in multiple colors and in accordance with its gaseous properties, enabling chromatic discrimination of different gases. The device converts the pressure generated by an injected gas into structural color, thereby “imaging” it.
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Modified Raman Microscopy Method Delivers Polymer Chain Measurements
Modified Raman Microscopy Method Delivers Polymer Chain Measurements
Researchers at NIST have developed a way to measure the 3D orientation of molecules within a material made of polymers. The measurement technique — based on broadband coherent anti-Stokes Raman scattering (BCARS) microscopy — will enable scientists to identify molecular orientation patterns that produce the mechanical, optical, and electrical properties that they seek for optimized materials to be used in medical devices and other items.
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Terahertz Microscopy Imaging Reveals How to Boost Perovskite Performance
Terahertz Microscopy Imaging Reveals How to Boost Perovskite Performance
To better evaluate perovskite solar cell material(s), scientists at Ames National Laboratory developed a microscope that simultaneously images at the THz frequency, and at nanometer spatial scales. Through THz nanoimaging, the scientists uncovered unexpected information about methylammonium lead iodide perovskite that could improve the material’s solar cell performance. This material is of interest as a potential replacement for silicon in solar cells.
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.: Featured Products & Services

 
HUBNER Photonics GmbH - Ultrafast Fiber Lasers with <50 fs Ultrafast Fiber Lasers with <50 fs

HUBNER Photonics GmbH
HÜBNER Photonics’ VALO Aalto femtosecond fiber lasers have pulse durations of <50 fs and peak powers of >2 MW from compact and stable turn-key systems. The lasers have very attractive features for applications in bioimaging, spectroscopy and micro-machining.

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Photonics Media - Photonics Spectra Reference Chart Photonics Spectra Reference Chart

Photonics Media
This full-color, 30 × 20.5-inch poster of the photonics spectrum displays the major commercial laser lines, detectors and optical materials in the ultraviolet to the far-infrared and beyond. The chart was updated in 2021 to reflect the changing technologies in the photonics industry. The convenient format makes it easy to quickly find the information you need.

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.: More News

 

Phase Retrieval Method Addresses Programmable PIC Calibration  Read Article 

Quantum Computing Integration Firm Bleximo Chooses Albany for Expansion  Read Article 

Microfabricated Fluidics Device Underpins Blood-Plasma Separation Method  Read Article 

Bio-Solar Cell Draws Electricity from Photosynthesis Process  Read Article 

Algorithms, Components Cut Turbulence in Free-Space Communications  Read Article 

.: Upcoming Webinars

 
Key Considerations for Part and Sample Holding in Interferometric Characterization Key Considerations for Part and Sample Holding in Interferometric Characterization
Wed, Jan 18, 2023 1:00 PM - 2:00 PM EST
Interferometry is a powerful tool when used to characterize optical surface form errors, as well as accumulated errors, when measuring transmitted wavefronts. Opticians and engineers have many methods available to facilitate such measurements but can often overlook the effects caused by part holding or fixturing. Frank DeWitt of XONOX Technology Inc. discusses what should be considered when approaching part holding and fixturing for interferometric measurements, the features that are critical to the item being measured, and the required outputs of the measurement.
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3D Optical Metrology: Capabilities for a New Era 3D Optical Metrology: Capabilities for a New Era
Thu, Jan 19, 2023 1:00 PM - 2:00 PM EST
Kevin Harding of Optical Metrology Solutions provides an overview of the many 3D optical metrology tools available today. He discusses applications from general manufacturing of durable parts to precision component measurement. He shares examples, typical performance specifications, and the limitations of the many tools on the market today. Harding then considers each technology for both the type of application it is best suited to address, as well as its speed and resolution. Finally, he shows where each technology fits within the bigger picture of practical applications.
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CALL FOR ARTICLES!
Photonics Media is currently seeking technical feature articles on a variety of topics for publication in our magazines (Photonics Spectra, BioPhotonics, and Vision Spectra). Please submit an informal 100-word abstract to [email protected], or use our online submission form.

 
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